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avatar for Michael Zoltek, GISP, CP, LS, CFedS

Michael Zoltek, GISP, CP, LS, CFedS

Pictometry International, Corp.
Vice President of Surveying & Mapping
Rochester, NY

Mr. Zoltek is a Licensed Professional Surveyor experienced since 1990 in a wide variety of public and private sector projects and currently holds active Surveying/Photogrammetry registrations in 23 states and the U.S. Virgin Islands, as well as being a Nevada State Water-Right Surveyor, a Certified Federal Surveyor (CFedS) and a Geographic Information Systems Professional (GISP).   Mr. Zoltek received his Bachelor of Science degree in Surveying & Mapping from the University of Florida in 1993. He has served as the responsible Surveyor for multi-crew private sector surveying departments as well as well as being the Lead Surveyor and Quality Assurance Manager for one of south Florida’s largest Right-of-Way mapping consultants.  Mr. Zoltek also served as the Vice President and Regional Manager providing oversight of multiple offices for a northwest Florida Surveying and Engineering firm before coming to Pictometry to coordinate and oversee the company’s national Surveying and Mapping needs. 

Mr. Zoltek has served as an expert witness and has been a guest lecturer at both the University of Florida and Troy University Geomatics Programs.  Mr. Zoltek has also been a presenter of professional technical seminars at the Rocket City Geospatial Symposium at Troy University, The Surveying and Mapping Society of Georgia (SAMSOG) Summer Conference, at Avatech Solutions’ in-house training seminars in Virginia Beach, VA and Las Vegas, NV and at Pictometry’s Futureview Conferences and various Pictometry User’s Groups (PUGs). Mr. Zoltek is a member of the American Society for Photogrammetry and Remote Sensing (ASPRS) and currently serves as the Director of the ASPRS Professional Practice Division. Mr. Zoltek’s primary experience in GIS is in the preparation of aerial imagery base-maps and control layers for Geographic Information Systems databases and the creation of composite mapping products requiring conformance with industry standard accuracy specifications.

My Speakers Sessions

Tuesday, October 20

10:30am PDT